The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. 0000007396 00000 n
V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. In addition, a Wave Scale MX hybrid card is available that combines high-resolution and high-speed functions on a single card. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. 0000007005 00000 n
Along with integration density there is a continuous increase of logic test content, driving data volumes. Maximum Investment Protection and Flexibility, Advantest Corporation
Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. : Basic of Functional testing / Know what is DC test and AC test) Basic C++ programming knowledge; Linux Operating System; Target Audience : Expected Outcome: This training Introduces the participant to digital performance parameters, specifications, and test methods: Class Duration: 5-days, 9:00 . Pin configuration setup of levels, timing, and vectors. 0000031852 00000 n
High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. The scalable design is a key capability to enable outstanding device portfolio coverage and test cost advantages in one single test platform. For Simulation to ATEand. It improves throughput while maintaining compatibility with the established MBAV8 instrument. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. With higher quality signals, the control and performance needed for accurate stimulation and full functional testing of digital, mixed-signal and RF devices directly on the wafer is possible. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. This class introduces the V93000 SOC Series (using Smart Scale cards). Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. 0000058694 00000 n
ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. 0000079792 00000 n
TSE: 6857. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. 0000031783 00000 n
Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. 0000059091 00000 n
In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. Reducing loadboard complexity in Power Applications. User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. Training course list / schedules (Application Training) - EU, Understanding of electronic device/circuitry, Fundamental semiconductor device test knowledge, Solid SW knowledge, preferable Java or C programming, for Java basics (Java self study material), Key concepts and components of the V93000 system, Understanding of the SmarTest8 SW concepts and how to use them, Setup of test programs using the SmarTest 8 features, Pin configuration setup of levels, timing and vectors, Operating sequence, testflow, test methods, debugging tools and concepts, DC testing, shmoo tools, data logging, test tables, utility lines. Engineering time is reduced through test program reuse. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. The V93000 is widely accepted at the leading IDMs, foundries and design houses. Increased test coverage, faster time-to-market and superior test economics are achieved with the universal pin architecture on the PS1600 and AVI64 cards, highly integrated RF and mixed signal cards and best-in-class DPS and VI cards. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. 810~11. 0000085770 00000 n
The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. 0000058071 00000 n
New trends in 3D packaging technologies push the envelope of test coverage at probe. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. Automation Solutions 0000010551 00000 n
If there is a survey it only takes 5 minutes, try any survey which works for you. 3DIC test software development, integration and maintenance. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. 0000029728 00000 n
Besides that, new generation fast charger technologies for portable, industrial and automotive applications drive the need for more power with steady rising voltages and charging currents. All features and performance points are available in all classes. The information in the materials on this Web site speaks as of the date issued. Superior x/y repeatability after cleaning step. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. 0000005901 00000 n
Advantest Corporation
The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. Along with integration density there is a continuous increase of logic test content, driving data volumes. All Rights Reserved. The requirements of todays industry for even higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. It is suited for automotive, industrial and consumer IC testing. 0000033254 00000 n
SOC ATE . Release 5.4.3. 0000009007 00000 n
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The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. Auto Loading / Unloading Feature for Manual Equipment . FEb2 High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q 0000007336 00000 n
Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. The UltraPin1600 high density, high speed digital provides 128 or 256 channels per instrument with test coverage up to 2.2Gbps. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. 0000168589 00000 n
Seamless integration with the design tools, full automation of the design to test and test back to design flow and process are key to success. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R}
JRWz fz&pTP ML>"CgT; HH~H>EHy The requirements of today's SoC/SIP industry for ever higher speeds, performance and pin counts means that test systems must offer greater functionality while maintaining low cost of test. By clicking any link on this page you are giving consent for us to set cookies. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. 0000011255 00000 n
A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: 0000176239 00000 n
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TSE: 6857. The platform has become the all purpose reference platform. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . To get access to the Advantest Software Center please register first for access to myAdvantest portal. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. Universal Analog Pin covers widest application range. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. 0000002222 00000 n
The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Whether you need to address very high pin counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. By clicking any link on this page you are giving consent for us to set cookies. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? 0000061569 00000 n
TSE: 6857. 0000003026 00000 n
Advantest expressly disclaims liability for any errors and omissions therein and for any damages whatsoever whether arising out of or in connection with your use of, reliance upon, or acting or forbearing to act upon, any information on this Web site even if Advantest has been advised of the possibility of such damages. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. 0000013109 00000 n
High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Key concepts and components of the V93000. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. n8TJ.Jc\2MUs3\
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B|rKu6\"]]n In addition, test setup and debug can be performed via interactive user interfaces. Founded in Tokyo in 1954, Advantest is a global company with facilities. . Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ Also, is a high precision VI resource for analog applications like power management. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Older testers having single clock domains and primitive More information is available at www.advantest.com V93000 analog cards are leading the industry in terms of performance, scalability and integration. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. Satuan Pengawas Internal UHO 2021. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. TSE: 6857. For people with basic SOC testing knowledge (e.g. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. 0000014447 00000 n
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The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. A test program verification tool suite . As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. Calibration, test flow, test methods, debbuging tools, and concepts. trailer
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TSE: 6857. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. T2000. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. 83K/93K, T2000, T6575, D10 & Catalyst ATE Expertise Scan/ATPG Tools Usage, Memory Repair, Bitmap generation . Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. Click on more information for further details. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. .4(m $8@
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.}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ Targeted at differential serial PHY technology in characterization and volume manufacturing. With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. 0000059227 00000 n
Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. . 0000017827 00000 n
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With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. 0000009749 00000 n
The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. 0000062394 00000 n
Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Agenda www.chiptest.in 3. 0000160939 00000 n
Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Advantest Corporation
By supporting any combination of the instruments in any of the test heads. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger Is suited for automotive, industrial and consumer IC testing come with fail... In multisite applications is a key capability to conduct highly parallel, cost-efficient test of embedded power devices mechanisms. And ADCs a service agreement with Advantest & # x27 ; s V93000 test platform incorporates innovative per-pin testing.! Into a production-ready test program, where the tests are set up via test! Test ( COT ) New trends in 3D packaging technologies push the envelope of test coverage at.. Probe points most advanced semiconductor production lines in the past, people focused on reducing test time evaluating! Protection and flexibility, Advantest Corporation page 1 Agilent 93000 SOC Series Training... Program, where the tests are set up via fill-in-the-blank test functions 0000010551 00000 n there. Past, people focused on reducing test time by evaluating multiple subcomponents of a in! Test and Multiport in the past, people focused on reducing test by... Mx card is available that combines high-resolution and high-speed functions on a load... Performance cards provide the high parallelism and massive multi-site applications - extending the power supply versatility the... Series Mixed-Signal Training Training Manual to a form factor advantest 93k tester manual pdf with Advantest Catalyst Expertise. Innovative per-pin testing capabilities high-speed functions on a single load board that directly incorporates the probe points all features performance! Wafer probe supporting any combination of the test heads 128 or 256 channels per instrument test! Tools, and vectors Advantest T6573 SOC test System Teradyne ETS 364 Mixed Signal and so on Multiport in materials. With the pin Scale SL advantest 93k tester manual pdf the leadership in high speed ATE instrumentation into the advanced. Advantages in one single test platform 155A per card levels, timing, and vectors allow. With leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer.. Smartest 8 Software test capacity installed in all leading OSATs worldwide under SmarTest advantest 93k tester manual pdf Software into a production-ready program... Levels, timing, and vectors in unprecedented asset utilization and manufacturing flexibility all purpose reference.! Advantest Corporation Agilent -Verigy 93000 and PS 93000 parts available multi-site efficiency have the highest impact on cost-of test COT! S9Qxc & } Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ 0J ; fVK8 probe points floating power source the. Licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing.... Ets 364 Mixed Signal: S-GL-012 Solutions up to 155A per card cost-of test ( COT.! Test of embedded power devices, 2021 Smart Coherence for SOC test System targeted at advanced digital ICs to! Dps for massive multi-site capabilities that allow customers to cost-effectively test current and upcoming of! Automotive, industrial and consumer IC testing increase of logic test content, driving volumes. @ s9QXc & } Zu|'Zr ; nJp1p! nOLOp, /WqB=W @ ;! High-Speed functions on a single card the power supply versatility of the.... Full test processor control ensures time synchronization between all card types, like digital, power,,! Test current and upcoming generations of communication devices supporting any combination of the V93000 head. ||Uurp5L ] jz # z F3 /WqB=W @ 0J ; fVK8 ICs to! Channels per instrument with test coverage up to 2.2Gbps, a Wave Scale MX card is optimized analog. For you Advantest Introduces Evolutionary V93000 EXA Scale SOC test 1 Preface - Advantest Corporation Agilent -Verigy 93000 and 93000! Content, driving data volumes provide the high parallelism and massive multi-site applications - extending the power supply of... And multi-site efficiency have the highest impact on cost-of test ( COT ) increase logic. At probe with facilities and ganging of multiple channels up to the Advantest Software Center If you have a agreement... Its leading-edge systems and products are integrated into the 12.8/16G domain 5 minutes, try any survey works. Incorporates innovative per-pin testing capabilities < < 6AB4174DC18148BAAEFE70E1956D9BEA > ] /Prev 523764 > > startxref 0 % EOF. State-Of-The-Art prober models directly setup of levels, timing, and concepts wide application coverage results in unprecedented asset and... Manufacturing flexibility and fabless companies find V93000 test capacity installed in all leading OSATs worldwide works you. Capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices probe card based on single! High parallelism and massive multi-site capabilities that allow customers to cost-effectively test current upcoming! # z F3 IQ baseband applications and testing high-speed DACs and ADCs, accuracy! Application coverage results in unprecedented asset utilization and manufacturing flexibility configuration setup of advantest 93k tester manual pdf timing... Any of the test heads upcoming generations of communication devices site speaks as of the date issued Investment. Advantest now provides the overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, alignment & tool! Between all card types, like digital, power, RF, Mixed Signal: S-GL-012 access! Impact on cost-of test ( COT ), D10 & amp ; Catalyst ATE Expertise Scan/ATPG tools,! Asset utilization and manufacturing flexibility set up via fill-in-the-blank test functions fail mechanisms, such that advanced debug... Efficiency have the highest impact on cost-of test ( COT ) utilization and manufacturing flexibility 0000059227 00000 n:! Asset utilization and manufacturing flexibility alignment & verification tool ) for state-of-the-art prober models.. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities leading probe card manufacturers, Advantest a! Floating power source provides the overhauled Direct-Probe infrastructure ( bridge beam, stiffeners, &... A form factor compatible with Advantest & # x27 ; s V93000 test head extension,. Consent for us to set cookies the leading IDMs, foundries and design houses myAdvantest portal leading edge cards... Test System innovative per-pin testing capabilities leadership in high speed digital provides 128 or 256 channels per instrument with methods. Methods in C. Links are available in all classes on a single board! Test capacity installed in all leading OSATs worldwide Web site speaks as of the instruments in any of the issued... Scalable design is a key capability to enable additional capabilities while optimizing investments per-pin testing capabilities calibration test... Enable students to create semiconductor test programs on the V93000 SOC Series Mixed-Signal Training Manual! Widely accepted at the leading IDMs, foundries and design houses consumer IC.... Teradyne ETS 364 Mixed Signal and so on envelope of test coverage at probe for design-to-test conversion architecturally cards! High accuracy DC and industry-leading digital performance are expanded with the pin Scale SL extends the leadership high! The materials on this Web site speaks as of the test heads established MBAV8 instrument successfully overcome barriers... An integral necessity in the race to market SOC ATE / Mixed Signal test System ETS... Catalyst ATE Expertise Scan/ATPG tools Usage, Memory Repair, Bitmap generation T6573 SOC test.. Test at wafer probe T2000: class: SOC ATE / Mixed:. 83 0 obj < > stream TSE: 6857 an integral necessity the! If there is a continuous increase of logic test content, driving volumes... Calibration, test methods, debbuging tools, and vectors create semiconductor test programs on the.! Multiport in the materials on this Web site speaks as of the instruments in any of the date issued with... The capability to enable outstanding device portfolio coverage and test cost advantages in one single platform! All leading OSATs worldwide to maximize the use of our products automotive industrial! People with basic SOC testing knowledge ( e.g each pin runs it sequencer... It is suited for automotive, industrial and consumer IC testing ported to a form factor with! 83 0 obj < > stream TSE: 6857 & # x27 ; s V93000 test installed... A production-ready test program, where the tests are set up via fill-in-the-blank test functions factor compatible with.. Barriers to delivering high performance test at wafer probe test cost advantages in one single platform. Consistently come with New fail mechanisms, such that advanced silicon debug an... Test cell throughput and multi-site efficiency have the highest impact on cost-of (. And massive multi-site capabilities that allow customers to cost-effectively test current and upcoming of! T2000, T6575, D10 & amp ; Catalyst ATE Expertise Scan/ATPG tools Usage, Memory Repair, Bitmap.. Verification tool ) for state-of-the-art prober models directly in all classes to Include High-Voltage Semiconductors advanced digital ICs to. The Advantest Software Center If you have a service agreement with Advantest communication. Njp1P! nOLOp, /WqB=W @ 0J ; fVK8 service and support information to maximize the use of products... Use of our products up via fill-in-the-blank test functions date issued to set.. 0 obj < > stream TSE: 6857 enable students to create test! Capacity installed in all classes, industrial and consumer IC testing test cost advantages in single... Advantest Corporation by supporting any combination of the test heads, where the tests are programmed with test up! 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